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Chemical Identification in the Specular and Off-Specular Rough-Surface Scattered Terahertz Spectra Using Wavelet Shrinkage
- Source :
- IEEE Access, Vol 9, Pp 29746-29754 (2021)
- Publication Year :
- 2021
- Publisher :
- IEEE, 2021.
-
Abstract
- We present the development and implementation of a novel wavelet shrinkage technique for the retrieval of obscured characteristic resonant signatures in the scattered terahertz (THz) reflectivity of molecular crystals. In this implementation, the wavelet basis functions associated with the absorption features were identified using the second-order total variation of the wavelet coefficients. Additionally, wavelet coefficients at certain scales were modified using the phase function corrections and wavelet hard thresholding. Reconstruction of the original spectra using these modified wavelet coefficients yielded the exact resonant frequencies of the chemicals, which were otherwise unrecognizable in the spectral artifacts of the rough surface scattering. We examined the robustness of this method over controlled levels of rough surface scattering, validated using the Kirchhoff approximation, in spectroscopic targets made from $\alpha $ -lactose monohydrate and 4-aminobenzoic acid (PABA), which have close spectral lines. We successfully retrieved the spectral absorption fingerprints in both specular and off-specular reflection geometries. This technique can be utilized for stand-off material characterization using the THz reflection spectroscopy in uncontrolled environments and potentially can be adopted for other broadband spectroscopic modalities.
- Subjects :
- Materials science
General Computer Science
Terahertz radiation
reflection-mode spectroscopy
maximal overlap discrete wavelet transform (MODWT)
02 engineering and technology
01 natural sciences
Spectral line
010309 optics
Wavelet
Optics
0103 physical sciences
Surface roughness
General Materials Science
Specular reflection
Chemical identification
Scattering
business.industry
General Engineering
phase function effects
021001 nanoscience & nanotechnology
Thresholding
rough surface scattering
Reflection (physics)
pyramid algorithm
lcsh:Electrical engineering. Electronics. Nuclear engineering
0210 nano-technology
business
lcsh:TK1-9971
Subjects
Details
- Language :
- English
- ISSN :
- 21693536
- Volume :
- 9
- Database :
- OpenAIRE
- Journal :
- IEEE Access
- Accession number :
- edsair.doi.dedup.....46e4dda836049e59ae9c03fc46b40051