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Review of temperature sensors as monitors for RF mmW built-in testing and self-calibration schemes
- Source :
- 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), Aug 2014, Texas, United States. pp.1081-1084, ⟨10.1109/MWSCAS.2014.6908606⟩, UPCommons. Portal del coneixement obert de la UPC, Universitat Politècnica de Catalunya (UPC), Recercat. Dipósit de la Recerca de Catalunya, Universitat Jaume I, MWSCAS
- Publication Year :
- 2014
- Publisher :
- HAL CCSD, 2014.
-
Abstract
- International audience; This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. The strategy is to embed small temperature sensors on the same silicon die as the circuit under test, taking advantage of empty spaces in the layout. This paper reviews the physical principles, and presents examples that reveal how temperature sensors can be used as functional built-in testers serving to reduce testing costs and enhance yield as part of self-healing strategies.
- Subjects :
- Engineering
Silicon
Amplificadors de potència
Elemental semiconductors
Hardware_PERFORMANCEANDRELIABILITY
02 engineering and technology
Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica [Àrees temàtiques de la UPC]
Millimetre wave circuits
01 natural sciences
temperature sensors
Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors [Àrees temàtiques de la UPC]
Hardware_INTEGRATEDCIRCUITS
0202 electrical engineering, electronic engineering, information engineering
Calibration
Electronic engineering
Temperature sensors
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Electronic circuit
Termometria -- Aparells i instruments
business.industry
Power amplifiers
010401 analytical chemistry
020206 networking & telecommunications
built in testing
Temperature measuring instruments
0104 chemical sciences
Built-in self test
Built-in self-test
Circuit testing
PACS 85.40
business
Circuit under test
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), Aug 2014, Texas, United States. pp.1081-1084, ⟨10.1109/MWSCAS.2014.6908606⟩, UPCommons. Portal del coneixement obert de la UPC, Universitat Politècnica de Catalunya (UPC), Recercat. Dipósit de la Recerca de Catalunya, Universitat Jaume I, MWSCAS
- Accession number :
- edsair.doi.dedup.....4646dad2352feea6dc56ab600e78dac8