Back to Search Start Over

Small-signal model for 2D-material based field-effect transistors targeting radio-frequency applications: the importance of considering nonreciprocal capacitances

Authors :
Pasadas, Francisco
Wei, Wei
Pallecchi, Emiliano
Happy, Henri
Jim��nez, David
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN)
Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
Carbon-IEMN (CARBON-IEMN)
Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
Instituto Ramon y Cajal de Investigacion Sanitaria [Madrid, Spain] (IRYCIS)
Universidad de Alcalá - University of Alcalá (UAH)
European UnionEuropean Commission [604391]
European Union's through the Horizon 2020 Research and Innovation Program [696656]
Ministerio de Economia y CompetitividadSpanish Government [TEC2012-31330, TEC2015-67462-C2-1-R]
Source :
IEEE Transactions on Electron Devices, IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2017, 64 (11), pp.4715-4723. ⟨10.1109/TED.2017.2749503⟩
Publication Year :
2017
Publisher :
HAL CCSD, 2017.

Abstract

A small-signal equivalent circuit of 2D-material based field-effect transistors is presented. Charge conservation and non-reciprocal capacitances have been assumed so the model can be used to make reliable predictions at both device and circuit levels. In this context, explicit and exact analytical expressions of the main radio-frequency figures of merit of these devices are given. Moreover, a direct parameter extraction methodology is provided based on S-parameter measurements. In addition to the intrinsic capacitances, transconductance and output conductance, our approach allows extracting the series combination of drain/source metal contact and access resistances. Accounting for these extrinsic resistances is of upmost importance when dealing with low dimensional field-effect transistors.<br />8 pages, 10 figures, 4 tables

Details

Language :
English
ISSN :
00189383
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices, IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2017, 64 (11), pp.4715-4723. ⟨10.1109/TED.2017.2749503⟩
Accession number :
edsair.doi.dedup.....44e0d5fb621ba1a036dfbe4241e8569f