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Thin-film transistor-driven vertically stacked full-color organic light-emitting diodes for high-resolution active-matrix displays

Authors :
Jong-Heon Yang
Chun-Won Byun
Seunghyup Yoo
Chan-mo Kang
Jin-Wook Shin
Nam Sung Cho
Sukyung Choi
Hee-Ok Kim
Kang Me Lee
Hyunsu Cho
Jun-Han Han
Hyunkoo Lee
Byoung-Hwa Kwon
Chi-Sun Hwang
Eungjun Kim
Source :
Nature Communications, Vol 11, Iss 1, Pp 1-9 (2020), Nature Communications
Publication Year :
2020
Publisher :
Nature Publishing Group, 2020.

Abstract

Thin-film transistor (TFT)-driven full-color organic light-emitting diodes (OLEDs) with vertically stacked structures are developed herein using photolithography processes, which allow for high-resolution displays of over 2,000 pixels per inch. Vertical stacking of OLEDs by the photolithography process is technically challenging, as OLEDs are vulnerable to moisture, oxygen, solutions for photolithography processes, and temperatures over 100 °C. In this study, we develop a low-temperature processed Al2O3/SiNx bilayered protection layer, which stably protects the OLEDs from photolithography process solutions, as well as from moisture and oxygen. As a result, transparent intermediate electrodes are patterned on top of the OLED elements without degrading the OLED, thereby enabling to fabricate the vertically stacked OLED. The aperture ratio of the full-color-driven OLED pixel is approximately twice as large as conventional sub-pixel structures, due to geometric advantage, despite the TFT integration. To the best of our knowledge, we first demonstrate the TFT-driven vertically stacked full-color OLED.<br />To realize organic light-emitting diodes (OLEDs) with improved resolution for display applications, a method for achieving high yield device fabrication is needed. Here, the authors report vertically-stacked transistor-driven full-color OLEDs with photolithography-processed intermediate electrodes.

Details

Language :
English
ISSN :
20411723
Volume :
11
Issue :
1
Database :
OpenAIRE
Journal :
Nature Communications
Accession number :
edsair.doi.dedup.....440a636178d245ed6d2568aff98f471e
Full Text :
https://doi.org/10.1038/s41467-020-16551-8