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Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing
- Source :
- Microelectronic Engineering. 102:41952
- Publication Year :
- 2013
-
Abstract
- Many ion-matter interactions exhibit [email protected] time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s^-^1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.
- Subjects :
- Materials science
Ion beam
ta221
Analytical chemistry
Hardware_PERFORMANCEANDRELIABILITY
Ion beam lithography
Proton beam writing
Front and back ends
Computer Science::Hardware Architecture
Data acquisition
Optics
Microscopy
Hardware_INTEGRATEDCIRCUITS
Electrical and Electronic Engineering
Field-programmable gate array
Hardware_REGISTER-TRANSFER-LEVELIMPLEMENTATION
ta114
business.industry
ta1182
Microbeam
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Physics::Accelerator Physics
business
Subjects
Details
- Language :
- English
- ISSN :
- 01679317
- Volume :
- 102
- Database :
- OpenAIRE
- Journal :
- Microelectronic Engineering
- Accession number :
- edsair.doi.dedup.....41dac80def242cc04500ce2b9690fb64