Disentangling elastic relaxation and ferroelectric domain contributions to in plane X-ray scattering profile: A necessity in strained ferroelectric superlattices

Authors :: M. Gharbi
Loic Dupont
Carine Davoisne
N. Lemée
F. Le Marrec
Laboratoire de Physique de la Matière Condensée - UR UPJV 2081 (LPMC)
Université de Picardie Jules Verne (UPJV)
Laboratoire réactivité et chimie des solides - UMR CNRS 7314 (LRCS)
Université de Picardie Jules Verne (UPJV)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)
Source :: Materials Letters, Materials Letters, Elsevier, 2020, 275, pp.128138-. ⟨10.1016/j.matlet.2020.128138⟩
Publication Year :: 2020
Publisher :: Elsevier BV, 2020.
Abstract: Ferroelectric nanodomains give rise to diffuse X-ray scattering peaks in ultrathin films. Here we study a Pb(Zr0.2Ti0.8)O3/SrTiO3 superlattice, using X-ray diffraction and transmission electron microscopy, We show that both elastic relaxation and ferroelectric nanodomain pattern can contribute to distinct satellite peaks in the X-ray scattering pattern. We show that transmission electron microscopy is required to disentangle elastic relaxation and ferroelectric domain contributions to the in plane X-ray scattering profile.

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