Robustness of topological states in Bi2Se3 thin film grown by Pulsed Laser Deposition on (0 0 1)-oriented SrTiO3 perovskite

We report on the reproducible surface topological electron states in Bi2Se3 topological insulator thin films when epitaxially grown by Pulsed Laser Deposition (PLD) on (0 0 1)-oriented SrTiO3 (STO) perovskite substrates. Bi2Se3 has been reproducibly grown with single (0 0 1)-orientation and low surface roughness as controlled by ex-situ X-ray diffraction and in situ scanning tunnel microscopy and low-energy electron diffraction. Finally, in situ synchrotron radiation angle-resolved photo-emission spectroscopy measurements show a single Dirac cone and Dirac point at E B ∼ 0.38 eV located in the center of the Brillouin zone likewise found from exfoliated single-crystals. These results demonstrate that the topological surface electron properties of PLD-grown Bi2Se3 thin films grown on (0 0 1)-oriented STO substrates open new perspectives for applications of multi-layered materials based on oxide perovskites.