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Dangling bonds in amorphous silicon investigated by multifrequency EPR
- Source :
- Journal of Non-Crystalline Solids. 358:2067-2070
- Publication Year :
- 2012
- Publisher :
- Elsevier BV, 2012.
-
Abstract
- Paramagnetic coordination defects in undoped hydrogenated amorphous silicon (a-Si:H) are studied using multifrequency pulsed electron-paramagnetic resonance (EPR) spectroscopy at S-, X-, Q- and W-band microwave frequencies (3.6, 9.7, 34, and 94 GHz, respectively). The improved spectral information extractable from a multifrequency fitting procedure allows us to conclude that the g tensor exhibits a rhombic splitting instead of axial symmetry. Our methods allow for precise and accurate determination of the g tensor principal values g x = 2.0079(2), g y = 2.0061(2) and g z = 2.0034(2) and their distribution parameters ( g strain).
- Subjects :
- Amorphous silicon
Materials science
Dangling bond
Analytical chemistry
Resonance
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
law.invention
chemistry.chemical_compound
Paramagnetism
chemistry
law
Materials Chemistry
Ceramics and Composites
Tensor
Spectroscopy
Electron paramagnetic resonance
Hyperfine structure
Subjects
Details
- ISSN :
- 00223093
- Volume :
- 358
- Database :
- OpenAIRE
- Journal :
- Journal of Non-Crystalline Solids
- Accession number :
- edsair.doi.dedup.....40501a8854dd21d2b7271c2361d312f2