Extraction of highly charged ions from the electron beam ion trap at LBNL for applications in surface analysis and materials science

Authors :: Arun Persaud
A. Kraemer
Thomas Schenkel
Alex V. Hamza
D. H. Schneider
J. P. Holder
J.W. McDonald
Source :: Schenkel, T.; Persaud, A.; Kraemer, A.; McDonald, J.W.; Holder, J.P.; Hamza, A.V.; et al.(2001). Extraction of highly charged ions from the electron beam ion trap at LBNL for applications in surface analysis and Materials Science. Lawrence Berkeley National Laboratory. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/8zk2j833
Publication Year :: 2002
Publisher :: AIP Publishing, 2002.
Abstract: We describe results from highly charged ion extraction experiments at the Electron Beam Ion Trap (EBIT) facility which is now operated at Lawrence Berkeley National Laboratory after transfer from Lawrence Livermore National Laboratory. Requirements on ion source performance for the application of highly charged ions (e.g., Xe44+) in surface analysis and materials science are discussed.

Subjects :: Nuclear physics
Materials science
Ion beam deposition
Ion beam
Physics
Extraction (chemistry)
Highly charged ion
Ion trap
Atomic physics
Instrumentation
Ion source
Electron beam ion trap
Ion

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