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Robust Alignment of Multi-Exposed Images with Saturated Regions
- Source :
- IEEE Access, Vol 8, Pp 221689-221699 (2020)
- Publication Year :
- 2020
- Publisher :
- arXiv, 2020.
-
Abstract
- It is challenging to align multi-exposed images due to large illumination variations, especially in presence of saturated regions. In this paper, a novel image alignment algorithm is proposed to cope with the multi-exposed images with saturated regions. Specifically, the multi-exposed images are first normalized by using intensity mapping functions (IMFs) in consideration of saturated pixels. Then, the normalized images are coded by using the local binary pattern (LBP). Finally, the coded images are aligned by formulating an optimization problem by using a differentiable Hamming distance. Experimental results show that the proposed algorithm outperforms state-of-the-art alignment methods for multi-exposed images in terms of alignment accuracy and robustness to exposure values.
- Subjects :
- Normalization (statistics)
Multi-exposed images
Brightness
General Computer Science
Computer science
Local binary patterns
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
02 engineering and technology
Hamming distance
Robustness (computer science)
0202 electrical engineering, electronic engineering, information engineering
FOS: Electrical engineering, electronic engineering, information engineering
General Materials Science
Electrical and Electronic Engineering
local binary pattern
Pixel
business.industry
Image and Video Processing (eess.IV)
General Engineering
Intensity mapping
020206 networking & telecommunications
Pattern recognition
Electrical Engineering and Systems Science - Image and Video Processing
image alignment
normalization
Computer Science::Computer Vision and Pattern Recognition
020201 artificial intelligence & image processing
Binary code
lcsh:Electrical engineering. Electronics. Nuclear engineering
Artificial intelligence
business
CS
lcsh:TK1-9971
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- IEEE Access, Vol 8, Pp 221689-221699 (2020)
- Accession number :
- edsair.doi.dedup.....3fd05627345b671567c0d7de7927d2be
- Full Text :
- https://doi.org/10.48550/arxiv.2012.10872