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A Methodology for Reconstructing DSET Pulses from Heavy-Ion Broad-Beam Measurements
- Source :
- Quantum Beam Science, Vol 4, Iss 1, p 15 (2020), Quantum Beam Science, Volume 4, Issue 1
- Publication Year :
- 2020
- Publisher :
- MDPI AG, 2020.
-
Abstract
- A table-based method for the estimation of heavy-ion-induced Digital Single Event Transient (DSET) voltage pulse-width in a single logic cell has been developed. The estimation method is based on the actual heavy-ion-induced transient current data in a single metal-oxide-semiconductor field effect transistor (MOSFET) used in the logic cell. The DSET pulse waveform in an inverter is obtained from which the pulse-width was estimated to be 420 ps. This DSET pulse-width value (420 ps) falls within the reasonable range of the DSET pulse-width distribution measured by the self-triggering flip-flop latch chain under heavy-ion irradiation test conditions.
- Subjects :
- Nuclear and High Energy Physics
01 natural sciences
lcsh:Technology
fully-depleted silicon-on-insulator (fd-soi)
Optics
single event transient pulse
0103 physical sciences
MOSFET
Range (statistics)
Irradiation
010306 general physics
010302 applied physics
Physics
business.industry
lcsh:T
single event effects
Atomic and Molecular Physics, and Optics
heavy ion
space environment
logic large scale integrations (lsis)
Inverter
Field-effect transistor
Transient (oscillation)
lcsh:Electrical engineering. Electronics. Nuclear engineering
business
lcsh:TK1-9971
Beam (structure)
Voltage
Subjects
Details
- Language :
- English
- Volume :
- 4
- Issue :
- 1
- Database :
- OpenAIRE
- Journal :
- Quantum Beam Science
- Accession number :
- edsair.doi.dedup.....3f6c40932a10fb775bb019d86b2b989f