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In situobservation of charge transfer and crystal field formationviahigh energy resolution X-ray spectroscopy during temperature programmed oxidation
- Source :
- Physical Chemistry Chemical Physics. 22:14731-14735
- Publication Year :
- 2020
- Publisher :
- Royal Society of Chemistry (RSC), 2020.
-
Abstract
- Herein, it has been demonstrated how resonant X-ray emission spectroscopy can be employed to study the charge transfer dynamics in real-time during the temperature-induced oxidation of metallic tungsten. Application of high energy resolution schemes allowed distinguishing charge transfer to separate orbitals resulting from crystal field splitting. Based on the time-resolved studies, it was possible to determine the corresponding charge transfer rates. From the experimental data, we determined that the electron transfer during the thermal oxidation of the metal dominates in the temperature range of 470-570 °C, reaching a maximum of 0.036 electrons per °C.
- Subjects :
- Thermal oxidation
X-ray spectroscopy
Materials science
Analytical chemistry
General Physics and Astronomy
02 engineering and technology
Electron
Atmospheric temperature range
010402 general chemistry
021001 nanoscience & nanotechnology
01 natural sciences
0104 chemical sciences
Crystal
Electron transfer
Crystal field theory
Emission spectrum
Physical and Theoretical Chemistry
0210 nano-technology
Subjects
Details
- ISSN :
- 14639084 and 14639076
- Volume :
- 22
- Database :
- OpenAIRE
- Journal :
- Physical Chemistry Chemical Physics
- Accession number :
- edsair.doi.dedup.....3e688305a95a110529b2689215618706