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Low-error and broadband microwave frequency measurement in a silicon chip

Authors :
Yanbing Zhang
Mikko Harjanne
Benjamin J. Eggleton
Blair Morrison
David Marpaung
Mattia Pagani
Timo Aalto
Markku Kapulainen
Alvaro Casas-Bedoya
Source :
Pagani, M, Morrison, B, Zhang, Y, Casas-Bedoya, A, Aalto, T, Harjanne, M, Kapulainen, M, Eggleton, B J & Marpaung, D 2015, ' Low-error and broadband microwave frequency measurement in a silicon chip ', Optica, vol. 2, no. 8, pp. 751-756 . https://doi.org/10.1364/OPTICA.2.000751
Publication Year :
2015

Abstract

Instantaneous frequency measurement (IFM) of microwave signals is a fundamental functionality for applications ranging from electronic warfare to biomedical technology. Photonic techniques, and nonlinear optical interactions in particular, have the potential to broaden the frequency measurement range beyond the limits of electronic IFM systems. The key lies in efficiently harnessing optical mixing in an integrated nonlinear platform, with low losses. In this work, we exploit the low loss of a 35 cm long, thick silicon waveguide, to efficiently harness Kerr nonlinearity, and demonstrate the first on-chip four-wave mixing (FWM) based IFM system. We achieve a large 40 GHz measurement bandwidth and record-low measurement error. Finally, we discuss the future prospect of integrating the whole IFM system on a silicon chip to enable the first reconfigurable, broadband IFM receiver with low-latency.<br />13 pages, 7 figures

Details

Language :
English
Database :
OpenAIRE
Journal :
Pagani, M, Morrison, B, Zhang, Y, Casas-Bedoya, A, Aalto, T, Harjanne, M, Kapulainen, M, Eggleton, B J & Marpaung, D 2015, ' Low-error and broadband microwave frequency measurement in a silicon chip ', Optica, vol. 2, no. 8, pp. 751-756 . https://doi.org/10.1364/OPTICA.2.000751
Accession number :
edsair.doi.dedup.....3c39f24c5ee8a4ae7919ed6230080066
Full Text :
https://doi.org/10.1364/OPTICA.2.000751