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Low-error and broadband microwave frequency measurement in a silicon chip
- Source :
- Pagani, M, Morrison, B, Zhang, Y, Casas-Bedoya, A, Aalto, T, Harjanne, M, Kapulainen, M, Eggleton, B J & Marpaung, D 2015, ' Low-error and broadband microwave frequency measurement in a silicon chip ', Optica, vol. 2, no. 8, pp. 751-756 . https://doi.org/10.1364/OPTICA.2.000751
- Publication Year :
- 2015
-
Abstract
- Instantaneous frequency measurement (IFM) of microwave signals is a fundamental functionality for applications ranging from electronic warfare to biomedical technology. Photonic techniques, and nonlinear optical interactions in particular, have the potential to broaden the frequency measurement range beyond the limits of electronic IFM systems. The key lies in efficiently harnessing optical mixing in an integrated nonlinear platform, with low losses. In this work, we exploit the low loss of a 35 cm long, thick silicon waveguide, to efficiently harness Kerr nonlinearity, and demonstrate the first on-chip four-wave mixing (FWM) based IFM system. We achieve a large 40 GHz measurement bandwidth and record-low measurement error. Finally, we discuss the future prospect of integrating the whole IFM system on a silicon chip to enable the first reconfigurable, broadband IFM receiver with low-latency.<br />13 pages, 7 figures
- Subjects :
- Silicon
Computer science
FOS: Physical sciences
chemistry.chemical_element
02 engineering and technology
7. Clean energy
01 natural sciences
010309 optics
020210 optoelectronics & photonics
0103 physical sciences
Broadband
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
Electronic warfare
Observational error
business.industry
Bandwidth (signal processing)
Ranging
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
Nonlinear system
chemistry
Photonics
business
Optics (physics.optics)
Physics - Optics
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Pagani, M, Morrison, B, Zhang, Y, Casas-Bedoya, A, Aalto, T, Harjanne, M, Kapulainen, M, Eggleton, B J & Marpaung, D 2015, ' Low-error and broadband microwave frequency measurement in a silicon chip ', Optica, vol. 2, no. 8, pp. 751-756 . https://doi.org/10.1364/OPTICA.2.000751
- Accession number :
- edsair.doi.dedup.....3c39f24c5ee8a4ae7919ed6230080066
- Full Text :
- https://doi.org/10.1364/OPTICA.2.000751