Influence of Ni on the refinement and twinning of primary Cu6Sn5 in Sn-0.7Cu-0.05Ni

The influence of Ni on the size and twinning of primary Cu6Sn5 crystals in Sn-0.7Cu-0.05Ni and Sn-xCu (x = 0.7, 0.9, 1.1) (mass%) solder joints is studied using synchrotron radiography and SEM-based EBSD. It is shown that the Ni addition does not cause significant refinement of primary Cu6Sn5 if the alloy is fully melted. However, for peak temperatures ≤250 °C relevant to industrial soldering, primary Cu6Sn5 are not completely melted in Sn-0.7Cu-0.05Ni and there are 10–100 times more numerous and smaller crystals than in Sn-0.7Cu. X-shaped Cu6Sn5 crystals with an angle of ∼70° commonly formed in Sn-0.7Cu-0.05Ni/Cu joints and are shown to be penetration twins. This type of growth twinning was only found in partially melted samples, both in Sn-0.7Cu-0.05Ni/Cu joints and binary Sn-1.1Cu alloy. The frequency of twinned crystals was significantly higher in Ni-containing solders. The results are discussed in terms of the influence of Ni on the Cu6Sn5 liquidus slope and on the lattice parameters of (Cu,Ni)6Sn5.