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Pd/B_4C/Y multilayer coatings for extreme ultraviolet applications near 10 nm wavelength
- Source :
- Applied Optics. 54:5850
- Publication Year :
- 2015
- Publisher :
- The Optical Society, 2015.
-
Abstract
- A new extreme ultraviolet (EUV) multilayer coating has been developed comprising Pd and Y layers with thin B4C barrier layers at each interface, for normal incidence applications near 10 nm wavelength. Periodic, nonperiodic, and dual-stack coatings have been investigated and compared with similar structures comprising either Mo/Y or Pd/B4C bilayers. We find that Pd/B4C/Y multilayers provide higher reflectance than either Mo/Y or Pd/B4C, with much lower film stress than Pd/B4C. We have also investigated the performance of periodic multilayers comprising repetitions of Pd/Y, Ru/Y, or Ru/B4C/Y, as well as Pd/B4C multilayers deposited using reactive sputtering with an Ar:N2 gas mixture in order to reduce stress: these material combinations were all found to provide poor EUV performance. The temporal stability of a periodic Pd/B4C/Y multilayer stored in air was investigated over a period of 16 months, and a slight reduction in peak reflectance was observed. Periodic Pd/B4C/Y multilayers were also found to be thermally stable up to 100°C; at higher temperatures (200°C and 300°C) we observe a slight reduction in peak reflectance and a slight increase in multilayer period. High-resolution transmission electron microscopy and selected area diffraction of an as-deposited Pd/B4C/Y film indicates a fully amorphous structure, with interfaces that are both smoother and more abrupt than those observed in a comparable Pd/B4C multilayer in which the Pd layers are polycrystalline. The new Pd/B4C/Y multilayers are suitable for normal-incidence imaging and spectroscopy applications, including solar physics, plasma physics, high-brightness EUV light sources, and others.
- Subjects :
- Materials science
business.industry
Materials Science (miscellaneous)
Industrial and Manufacturing Engineering
Amorphous solid
Wavelength
Optics
Sputtering
Transmission electron microscopy
Extreme ultraviolet
Crystallite
Business and International Management
Selected area diffraction
business
Spectroscopy
Subjects
Details
- ISSN :
- 15394522 and 00036935
- Volume :
- 54
- Database :
- OpenAIRE
- Journal :
- Applied Optics
- Accession number :
- edsair.doi.dedup.....37b31364ed1efe48b7455b834192f9a9
- Full Text :
- https://doi.org/10.1364/ao.54.005850