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Performance of a TiN-coated monolithic silicon pin-diode array under mechanical stress
- Publication Year :
- 2012
- Publisher :
- arXiv, 2012.
-
Abstract
- The Karlsruhe Tritium Neutrino Experiment (KATRIN) will detect tritium beta- decay electrons that pass through its electromagnetic spectrometer with a highly- segmented monolithic silicon pin-diode focal-plane detector (FPD). This pin-diode array will be on a single piece of 500-{\mu}m-thick silicon, with contact between titanium nitride (TiN) coated detector pixels and front-end electronics made by spring-loaded pogo pins. The pogo pins will exert a total force of up to 50N on the detector, deforming it and resulting in mechanical stress up to 50 MPa in the silicon bulk. We have evaluated a prototype pin-diode array with a pogo-pin connection scheme similar to the KATRIN FPD. We find that pogo pins make good electrical contact to TiN and observe no effects on detector resolution or reverse-bias leakage current which can be attributed to mechanical stress.<br />Comment: 13 pages, 7 figures
- Subjects :
- Physics
Nuclear and High Energy Physics
Physics - Instrumentation and Detectors
Silicon
business.industry
Pogo pin
Detector
PIN diode
chemistry.chemical_element
FOS: Physical sciences
Instrumentation and Detectors (physics.ins-det)
Electrical contacts
law.invention
chemistry
law
Optoelectronics
Nuclear Experiment (nucl-ex)
Tin
business
Instrumentation
Nuclear Experiment
Diode
KATRIN
Subjects
Details
- Database :
- OpenAIRE
- Accession number :
- edsair.doi.dedup.....35a74fca69f5bed51ecd93621beefe6b
- Full Text :
- https://doi.org/10.48550/arxiv.1202.0320