Back to Search
Start Over
ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier
- Source :
- Microelectronics Reliability. :433-437
- Publication Year :
- 2018
- Publisher :
- Elsevier, 2018.
-
Abstract
- Condition monitoring plays an important role in estimating health condition of capacitors because the ageing of the capacitors is usually accompanied by an increase in equivalent series resistance (ESR) and a decrease in capacitance. Either capacitance or ESR cannot be a unique indicator of the lifetime of capacitors in some cases. This paper presents a condition monitoring method of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier intended for motor drives. The monitoring method extracts both the ESR and capacitance of a capacitor under test from the actual ripple current and voltage without disconnecting the capacitor nor injecting an additional current. The monitoring method, therefore, can be implemented online. Experimental results verify that the monitoring method independently obtains the ESR and capacitance changes of the capacitor under test. This contributes to accurate lifetime estimation of dc-link capacitors.
- Subjects :
- Materials science
Ripple
02 engineering and technology
Hardware_PERFORMANCEANDRELIABILITY
Diode rectifiers
01 natural sciences
Capacitance
law.invention
Front and back ends
DC-link capacitors
law
Hardware_GENERAL
Three-phase inverters
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
Hardware_INTEGRATEDCIRCUITS
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
010302 applied physics
Equivalent series resistance
business.industry
020208 electrical & electronic engineering
Electrical engineering
Condition monitoring
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Capacitor
Diode rectifier
business
Voltage
Subjects
Details
- Language :
- English
- ISSN :
- 00262714
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability
- Accession number :
- edsair.doi.dedup.....354a65fef899d1813a67c543cf6b5bcd