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The Standardized Video Interview: How Does It Affect the Likelihood to Invite for a Residency Interview?

Authors :
William Caputo
Jan M. Shoenberger
Abbas Husain
Michael C. Bond
Moshe Weizberg
Daniel J. Egan
Todd Taylor
Arlene S. Chung
Brahim Ardolic
Kaushal Shah
Jeffrey Todd Van Dermark
Matthew Silver
Melissa White
Ida Li
Jonathan Bronner
William C. Krauss
Lukasz Cygan
Source :
AEM Education and Training. 3:226-232
Publication Year :
2019
Publisher :
Wiley, 2019.

Abstract

BACKGROUND: The Association of American Medical Colleges instituted a standardized video interview (SVI) for all applicants to emergency medicine (EM). It is unclear how the SVI affects a faculty reviewer's decision on likelihood to invite an applicant (LTI) for an interview. OBJECTIVES: The objective was to determine whether the SVI affects the LTI. METHODS: Nine Accreditation Council of Graduate Medication Education (ACGME)‐accredited EM residency programs participated in this prospective, observational study. LTI was defined on a 5‐point Likert scale as follows: 1 = definitely not invite, 2 = likely not invite, 3 = might invite, 4 = probably invite, 5 = definitely invite. LTI was recorded at three instances during each review: 1) after typical screening (blinded to the SVI), 2) after unblinding to the SVI score, and 3) after viewing the SVI video. RESULTS: Seventeen reviewers at nine ACGME‐accredited residency programs participated. We reviewed 2,219 applications representing 1,424 unique applicants. After unblinding the SVI score, LTI did not change in 2,065 (93.1%), increased in 85 (3.8%) and decreased in 69 (3.1%; p = 0.22). In subgroup analyses, the effect of the SVI on LTI was unchanged by United States Medical Licensing Examination score. However, when examining subgroups of SVI scores, the percentage of applicants in whom the SVI score changed the LTI was significantly different in those that scored in the lower and upper subgroups (p

Details

ISSN :
24725390
Volume :
3
Database :
OpenAIRE
Journal :
AEM Education and Training
Accession number :
edsair.doi.dedup.....3367f806d2c167df803230d9f8c7c3ec