Examining Edge-Termination Performance and Failure in Vertical GaN and AlGaN Power Diodes Using Scanning-Beam Techniques

Authors :: Robert Kaplar
Léonard, F.
Collins, K. C.
Armstrong, A. M.
Dickerson, J. R.
King, M. P.
Allerman, A. A.
Crawford, M. H.
Talin, A. A.
Source :: Scopus-Elsevier
Publication Year :: 2017
Publisher :: ASM International, 2017.
Abstract: This article discusses the use of scanning-beam techniques such as EBIC, IBIC, and OBIC to optimize the design of edge-termination structures in vertical GaN and AlGaN power diodes.

Subjects :: Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality

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