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Calibration of a 2 dimensional hydrogenated amorphous silicon thin film position sensitive detector (2D a-Si:H TFPSD)
- Source :
- Scopus-Elsevier
- Publication Year :
- 2003
- Publisher :
- EDP Sciences, 2003.
-
Abstract
- It is well known that for a 2 dimensional hydrogenated amorphous silicon thin film position sensitive detector (a-Si:H TFPSD), the calculated coordinates of the position, from the currents measured on the PSD, do not represent the real spot position. The errors result from the generally used position-current expression, and also from device fabrication defects such as the inhomogeneity of TCO thickness and the electrode contact resistance. The best way to correct the errors is to calibrate the device. In this paper, we present a calibration method developed earlier for a smart pressure sensor to calibrate a 2D tetralateral a-Si:H TFPSD. The calibration algorithm is presented. Experimental results are shown and the calibration error is discussed.
- Subjects :
- Amorphous silicon
Materials science
Silicon
business.industry
Detector
chemistry.chemical_element
Condensed Matter Physics
Pressure sensor
Electronic, Optical and Magnetic Materials
Metrology
chemistry.chemical_compound
Optics
chemistry
Position (vector)
Calibration
Thin film
business
Instrumentation
Subjects
Details
- ISSN :
- 12860050 and 12860042
- Volume :
- 24
- Database :
- OpenAIRE
- Journal :
- The European Physical Journal Applied Physics
- Accession number :
- edsair.doi.dedup.....2fcd1cdd2ad51a6f645753cc623607da
- Full Text :
- https://doi.org/10.1051/epjap:2003072