Back to Search Start Over

Is FD-SOI immune to floating body effects?

Authors :
Sorin Cristoloveanu
Hyungjin Park
Kyung Hwa Lee
Jean-Pierre Colinge
Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC )
Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI)
Direction de Recherche Technologique (CEA) (DRT (CEA))
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
European Project: 687931,H2020,H2020-ICT-2015,REMINDER(2016)
European Project: 662175,H2020,ECSEL-2014-2,WAYTOGO FAST(2015)
Source :
2018 S3S Proceedings, 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2018, San Francisco, United States. pp.20.4, ⟨10.1109/S3S.2018.8640198⟩
Publication Year :
2018
Publisher :
HAL CCSD, 2018.

Abstract

session: SOI devices 2; International audience; Evidence for floating-body effects (FBE) in fully-depleted SOI with thickness below 25 nm is found from experiments. We investigate several facets of FBE: parasitic bipolar action, kink effect, transient current, hysteresis, steep subthreshold slope and meta-stable dip. The body potential is measured together with the drain current in order to demonstrate their close correlation, in particular for out-of-equilibrium operation. The FBEs are shown to interfere with gate tunneling and super-coupling effects.

Details

Language :
English
ISBN :
978-1-5386-7627-1
ISBNs :
9781538676271
Database :
OpenAIRE
Journal :
2018 S3S Proceedings, 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2018, San Francisco, United States. pp.20.4, ⟨10.1109/S3S.2018.8640198⟩
Accession number :
edsair.doi.dedup.....2eb7729d7517c2f3f334490c4083fd74