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Low-voltage gallium-indium-zinc-oxide thin film transistors based logic circuits on thin plastic foil: Building blocks for radio frequency identification application
- Source :
- Applied Physics Letters, 16, 98
- Publication Year :
- 2011
-
Abstract
- In this work a technology to fabricate low-voltage amorphous gallium-indium-zinc oxide thin film transistors (TFTs) based integrated circuits on 25 mu m foils is presented. High performance TFTs were fabricated at low processing temperatures (< 150 degrees C) with field effect mobility around 17 cm(2)/V s. The technology is demonstrated with circuit building blocks relevant for radio frequency identification applications such as high-frequency functional code generators and efficient rectifiers. The integration level is about 300 transistors. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3579529] ispartof: Applied Physics Letters vol:98 issue:16 status: published
- Subjects :
- Integration levels
Physics and Astronomy (miscellaneous)
Radio frequency identification (RFID)
HOL - Holst
Gallium
semiconductors
02 engineering and technology
Integrated circuit
Hardware_PERFORMANCEANDRELIABILITY
01 natural sciences
Indium
law.invention
law
Low-voltage
010302 applied physics
TS - Technical Sciences
field-effect transistors
Transistor
Radio waves
Electric rectifiers
021001 nanoscience & nanotechnology
Zinc
Thin-film transistor
Logic gate
Optoelectronics
Field-effect transistor
0210 nano-technology
Low processing temperature
Materials science
Indium zinc oxides
Thin films
chemistry.chemical_element
Functional codes
Processing
High frequency HF
Field-effect mobilities
0103 physical sciences
Zinc oxide
Hardware_INTEGRATEDCIRCUITS
Electronics
business.industry
Plastic foils
Building blockes
Thin film transistors
Mechatronics, Mechanics & Materials
Switching circuits
Thin film circuits
chemistry
business
Amorphous films
Low voltage
Logic circuits
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Applied Physics Letters, 16, 98
- Accession number :
- edsair.doi.dedup.....2e35d0ad3943fac3cc99e52a779b340f