MnxGe1−x thin layers studied by TEM, X-ray absorption spectroscopy and SQUID magnetometry

Authors :: P. De Padova
O. Heckmann
K. Hricovini
J.-P. Ayoub
Amina Taleb-Ibrahimi
J.-M. Mariot
M.C. Richter
Isabelle Berbezier
Bruno Olivieri
A.M. Testa
Silvia Picozzi
Dino Fiorani
Source :: Surface science 601 (2007): 2628–2631., info:cnr-pdr/source/autori:De Padova, P; Ayoub, JP; Berbezier, I; Mariot, JM; Taleb-Ibrahimi, A; Richter, MC; Heckmann, O; Testa, AM; Fiorani, D; Olivieri, B; Picozzi, S; Hricovini, K/titolo:MnxGe1-x thin layers studied by TEM, X-ray absorption spectroscopy and SQUID magnetometry/doi:/rivista:Surface science/anno:2007/pagina_da:2628/pagina_a:2631/intervallo_pagine:2628–2631/volume:601
Publication Year :: 2007
Publisher :: Elsevier BV, 2007.
Abstract: Mn0.06Ge0.94 samples have been grown by molecular-beam epitaxy on Ge(001)2 x 1. High-resolution transmission electron microscopy shows the coexistence of an ordered diluted Mn0.06Ge0.94 film and of nanoscopic crystallites, which were identified as Mn5Ge3 by electron diffraction. The magnetic properties of the Mn0.06Ge0.94 samples show a superposition of a paramagnetic behavior, due to the interaction of Mn atoms diluted in the Ge host, and a ferromagnetic behavior attributed to the Mn5Ge3 crystallites dispersed into the films. The Mn L-2.3 X-ray absorption spectra of the Mn0.06Ge0.94 films exhibit a lineshape typical of metallic Mn, with considerably reduced multiplet structure. (C) 2006 Elsevier B.V. All rights reserved.

Subjects :: X-ray absorption spectroscopy
Absorption spectroscopy
Chemistry
Analytical chemistry
Surfaces and Interfaces
FERROMAGNETIC SEMICONDUCTOR
Condensed Matter Physics
MN
Surfaces, Coatings and Films
Paramagnetism
Crystallography
Electron diffraction
Transition metal
MAGNETIC-PROPERTIES
Transmission electron microscopy
Materials Chemistry
Crystallite
MN 5

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