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Terahertz spectroscopy of Ni-Ti alloy thin films

Authors :
Yun-Shik Lee
A. D. Jameson
Joshua W. Kevek
J. Ong
J. L. Tomaino
M. J. Paul
Ethan D. Minot
Milo Koretsky
M. Hemphill-Johnston
Source :
Scopus-Elsevier

Abstract

Using THz spectroscopy, we obtained the resistivity of Ni-Ti alloy thin-films as a function of Ti concentration. The resistivity sharply increases near the phase transition boundaries, Ti concentrations of 22%, 44% and 62%.

Subjects

Subjects :
Phase transition
Optical rectification
Materials science
Electrical resistivity and conductivity
Alloy
Analytical chemistry
engineering
Titanium alloy
Thin film
engineering.material
Thz spectroscopy
Terahertz spectroscopy and technology

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier
Accession number :
edsair.doi.dedup.....2c8cfe1afb22ff8806cdf94430f34067

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