Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Details

Language :

English

ISBN :

978-1-66545-938-9

ISBNs :

9781665459389

Database :

OpenAIRE

Journal :

2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Accession number :

edsair.doi.dedup.....2c7a2184dee5bd49144881d6d566e760

Full Text :

https://doi.org/10.1109/dft56152.2022.9962335