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Parametric faults detection and concealment on imager with FPGA implementation

Authors :
Ghislain Takam Tchendjou
Emmanuel Simeu
Reliable RF and Mixed-signal Systems (RMS )
Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA)
Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )
Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )
Université Grenoble Alpes (UGA)
BEN TITO, Laurence
Source :
IEEE Latin-American Test Symposium (LATS 2020), IEEE Latin-American Test Symposium (LATS 2020), Mar 2020, Maceio, Brazil. pp.1-6, LATS
Publication Year :
2020
Publisher :
HAL CCSD, 2020.

Abstract

International audience; This paper presents an online and integrated solution for self-healing of parametric faults on an image sensor. This self-healing is based on the detection and concealment of the parametric faults in the image sensor. Three detection methods are considered. The first one is based on the distance between the pixel under test and its neighboring pixels, the second method is based on the median of the block of pixels around the pixel under test, and the third method is based on the local dispersion parameters in the image. The concealment method is based on the median filter, which consists of the substitution of the defective value by the median value of the pixel block. The metrics used for comparison of the experimental results are phi-coefficient, peak signal to noise ratio (PSNR) and a full reference image quality assessment method based on machine learning techniques (FrIQA). The detection and concealment processes are implemented on an FPGA platform to evaluate the computational complexity and to confirm the feasibility of integrating the proposed solutions in an image sensor.

Details

Language :
English
Database :
OpenAIRE
Journal :
IEEE Latin-American Test Symposium (LATS 2020), IEEE Latin-American Test Symposium (LATS 2020), Mar 2020, Maceio, Brazil. pp.1-6, LATS
Accession number :
edsair.doi.dedup.....2c3a12d2627c14bb12d8aa5f94a75502