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In-Situ Calibration and De-Embedding Test Structure Design for SiGe HBT On-Wafer Characterization up to 500 GHz
- Source :
- 2020 94th ARFTG Microwave Measurement Symposium (ARFTG)
- Publication Year :
- 2020
- Publisher :
- IEEE, 2020.
-
Abstract
- In this paper, we present an in-situ thru-reflect-line (TRL) calibration and de-embedding kit that sets the reference plane in close proximity to the device under test. This is made possible thanks to the realization of the standards at the metal3 BEOL level, instead of the common meta1-8 solution. This novel calibration kit has been compared to classic TRL, both for parasitics assessment and by direct application on the active device (HBT) measurements.
- Subjects :
- 010302 applied physics
Materials science
business.industry
Heterojunction bipolar transistor
020206 networking & telecommunications
02 engineering and technology
01 natural sciences
Capacitance
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
Calibration
Embedding
Optoelectronics
Device under test
Wafer
Parasitic extraction
business
Realization (systems)
Subjects
Details
- ISBN :
- 978-1-72812-056-0
- ISBNs :
- 9781728120560
- Database :
- OpenAIRE
- Journal :
- 2020 94th ARFTG Microwave Measurement Symposium (ARFTG)
- Accession number :
- edsair.doi.dedup.....2b86ce4bd557be685673cd7e93c97462