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Computer-Aided Imaging

Authors :
Patrick Echlin
David B. Williams
Joseph I. Goldstein
Charles E. Fiori
Klaus-Ruediger Peters
Dale E. Newbury
John T. Armstrong
Eric Lifshin
Alton D. Romig
Charles E. Lyman
David C. Joy
Source :
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy ISBN: 9780306435911
Publication Year :
1990
Publisher :
Springer US, 1990.

Abstract

This laboratory is concerned with use of the digital computer to aid in the acquisition, display, and interpretation of various digital images obtained with the scanning electron microscope, e.g., secondary electron, backscattered electron, x-ray, etc. We will be concerned with all aspects of SEM imaging from the generation of the signal, when the electron beam interacts with the specimen surface, to the perception and interpretation of this information in the mind of the observer. Indeed, we will view all steps involved as an information channel which has certain imperfections and nonlinearities that must be examined. This aspect of microscopy is a rapidly developing area and consequently it is difficult to condense all of the important concepts into a single laboratory exercise. Nevertheless, the topics covered in the following experiments should give a sense of the power of this new tool for the microscopist. For more details see ASEMXM, Chapter 5, and references [1–4] at the end of the laboratory.

Details

ISBN :
978-0-306-43591-1
ISBNs :
9780306435911
Database :
OpenAIRE
Journal :
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy ISBN: 9780306435911
Accession number :
edsair.doi.dedup.....2a722a749dd24fd04c481c680a6f593f
Full Text :
https://doi.org/10.1007/978-1-4613-0635-1_17