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In Situ X-ray Diffraction Study of GaN Nucleation on Transferred Graphene

Authors :
Patrick Le Fèvre
Tao Zhou
Jean-Christophe Harmand
Ludovic Largeau
Noelle Gogneau
Frank Glas
Ali Madouri
Olivier Geaymond
Maria Tchernycheva
Laurent Travers
Martina Morassi
Antonella Cavanna
Camille Barbier
Gilles Renaud
Source :
Crystal Growth & Design
Publication Year :
2020

Abstract

We investigate by in situ X-ray diffraction the early stage of GaN nanowire growth on a single layer of polycrystalline graphene transferred onto a Si(100)/SiO2 carrier substrate. The experiment wa...

Details

ISSN :
15287483
Database :
OpenAIRE
Journal :
Crystal Growth & Design
Accession number :
edsair.doi.dedup.....2a46acfa6f42ca121f8d55899d18f270
Full Text :
https://doi.org/10.1021/acs.cgd.0c00306