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Computational Methodology for the Prediction of Functional Requirement Variations Across the Product Life-Cycle
- Source :
- 11th CIRP Conference on Computer Aided Tolerancing “Geometric Variations within Product Life-Cycle Management”, 11th CIRP Conference on Computer Aided Tolerancing “Geometric Variations within Product Life-Cycle Management”, Mar 2009, Annecy, France, HAL
- Publication Year :
- 2009
-
Abstract
- The great majority of engineered products are subject to thermo-mechanical loads which vary with the product environment during the various phases of its life-cycle (machining, assembly, intended service use...). Those load variations may result in different values of the parts nominal dimensions, which in turn generate corresponding variation of the effective clearance (functional requirement) in the assembly. Usually, and according to the contractual drawings, the parts are measured after the machining stage, whereas the interesting measurement values are the ones taken in service for they allow the prediction of clearance value under operating conditions. Unfortunately, measurement in operating conditions may not be practical to obtain. Hence, the main purpose of this research is to create, through computations and simulations, links between the values of the loads, dimensions and functional requirements during the successive phases of the life cycle of some given product. [...]
- Subjects :
- assembly
TTRS
clearances
life cycle
functional requirements
Classical Physics (physics.class-ph)
FOS: Physical sciences
tolerances
product
Physics - Classical Physics
dimensions
[SPI.MECA.GEME]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- 11th CIRP Conference on Computer Aided Tolerancing “Geometric Variations within Product Life-Cycle Management”, 11th CIRP Conference on Computer Aided Tolerancing “Geometric Variations within Product Life-Cycle Management”, Mar 2009, Annecy, France, HAL
- Accession number :
- edsair.doi.dedup.....29f11fc862ad174133786dcec95d518d