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Dual phase grating based X-ray differential phase contrast imaging with source grating: theory and validation
- Source :
- Optics express. 28(7)
- Publication Year :
- 2020
-
Abstract
- In this work, we developed a new theoretical framework using wave optics to explain the working mechanism of the grating based X-ray differential phase contrast imaging (XPCI) interferometer systems consist of more than one phase grating. Under the optical reversibility principle, the wave optics interpretation was simplified into the geometrical optics interpretation, in which the phase grating was treated as a thin lens. Moreover, it was derived that the period of an arrayed source, e.g., the period of a source grating, is always equal to the period of the diffraction fringe formed on the source plane. When a source grating is utilized, the theory indicated that it is better to keep the periods of the two phase gratings different to generate large period diffraction fringes. Experiments were performed to validate these theoretical findings.
- Subjects :
- Diffraction
Physics
Geometrical optics
business.industry
Phase (waves)
Phase-contrast imaging
Physics::Optics
02 engineering and technology
Grating
021001 nanoscience & nanotechnology
Physical optics
01 natural sciences
Atomic and Molecular Physics, and Optics
010309 optics
Interferometry
Optics
Thin lens
0103 physical sciences
0210 nano-technology
business
Subjects
Details
- ISSN :
- 10944087
- Volume :
- 28
- Issue :
- 7
- Database :
- OpenAIRE
- Journal :
- Optics express
- Accession number :
- edsair.doi.dedup.....2917e61120e06f9cabce0da171558d40