Mode analysis in He+-implanted lithium fluoride planar waveguides

Authors :: F. Bonfigli
B. Jacquier
F. Menchini
R. M. Montereali
P. Moretti
E. Nichelatti
M. Piccinini
H. Rigneault
SOMMA, Fabrizia
F., Bonfigli
B., Jacquier
F., Menchini
R. M., Montereali
P., Moretti
E., Nichelatti
M., Piccinini
H., Rigneault
Somma, Fabrizia
Mussi, V.
Moretti, P.
Mugnier, J.
Jacquier, B.
Montereali, R. M.
Nichelatti, E.
Source :: Applied Physics Letters. 82:3886-3888
Publication Year :: 2003
Publisher :: AIP Publishing, 2003.
Abstract: The depth refractive index profiles of broadband visible-emitting planar waveguides produced in LiF crystals with 1.5- and 2-MeV He+ ions at different doses have been derived from mode analysis. They show that there are two competitive mechanisms responsible for positive and negative modifications of the refractive index in the irradiated volume associated with different processes of energy deposition of the incident ions, so as to induce a complex coloration profile along the penetration direction, which is strongly dependent on the irradiation dose.