X-ray reflectivity of a Langmuir monolayer on water

Authors :: Louis Bosio
François Rieutord
J. J. Benattar
Laboratoire Interfaces et Systèmes Electrochimiques (LISE)
Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Source :: Revue de Physique Appliquée, Revue de Physique Appliquée, Société française de physique / EDP, 1987, 22 (8), pp.775-778. ⟨10.1051/rphysap:01987002208077500⟩, Revue de Physique Appliquée, 1987, 22 (8), pp.775-778. ⟨10.1051/rphysap:01987002208077500⟩
Publication Year :: 1987
Publisher :: HAL CCSD, 1987.
Abstract: We built a special Langmuir through allowing the use of X-ray reflectivity. Using the device we studied for the first time the density profile of a Langmuir monolayer directly on water. This experiment opens new prospects in particular to measure the roughness of solid films on water subphase.

Language :: English
ISSN :: 00351687 and 27773671
Database :: OpenAIRE
Journal :: Revue de Physique Appliquée, Revue de Physique Appliquée, Société française de physique / EDP, 1987, 22 (8), pp.775-778. ⟨10.1051/rphysap:01987002208077500⟩, Revue de Physique Appliquée, 1987, 22 (8), pp.775-778. ⟨10.1051/rphysap:01987002208077500⟩
Accession number :: edsair.doi.dedup.....287c11820257621c9eaca32b1b5bc9c9
Full Text :: https://doi.org/10.1051/rphysap:01987002208077500⟩