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Annealing of SnO_2 thin films by ultra-short laser pulses
- Source :
- Optics express, 22(S3), A607-A621. The Optical Society, Optics Express, 22 (S3), 2014, Optics Express, SUPPL. 3, 22, A607-A621
- Publication Year :
- 2014
- Publisher :
- The Optical Society, 2014.
-
Abstract
- Post-deposition annealing by ultra-short laser pulses can modify the optical properties of SnO2 thin films by means of thermal processing. Industrial grade SnO2 films exhibited improved optical properties after picosecond laser irradiation, at the expense of a slightly increased sheet resistance [Proc. SPIE 8826, 88260I (2013)]. The figure of merit f = T10 / Rsh was increased up to 59% after laser processing. In this paper we study and discuss the causes of this improvement at the atomic scale, which explain the observed decrease of conductivity as well as the observed changes in the refractive index n and extinction coefficient k. It was concluded that the absorbed laser energy affected the optoelectronic properties preferentially in the top 100-200 nm region of the films by several mechanisms, including the modification of the stoichiometry, a slight desorption of dopant atoms (F), adsorption of hydrogen atoms from the atmosphere and the introduction of laser-induced defects, which affect the strain of the film. cop. 2014 Optical Society of America.
- Subjects :
- Materials science
Annealing (metallurgy)
solar energy
transparent conductive coatings
law.invention
laser materials processing
Optics
Ultra Short Laser Pulses
Optical transmittance
law
LIPSS
nanostructures
Mechanics, Materials and Structures
Figure of merit
Thin film
Irradiation
Sheet resistance
TS - Technical Sciences
Industrial Innovation
Laser surface modification
Dopant
business.industry
Physics
Laser
Atomic and Molecular Physics, and Optics
subwavelength structures
TFT - Thin Film Technology
ultrafast lasers
business
Refractive index
SnO2
Subjects
Details
- ISSN :
- 10944087
- Volume :
- 22
- Database :
- OpenAIRE
- Journal :
- Optics Express
- Accession number :
- edsair.doi.dedup.....27f2e24e915b296445d4dae5d46faefb
- Full Text :
- https://doi.org/10.1364/oe.22.00a607