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Silicon Chemical Vapor Deposition Process Using a Half-Inch Silicon Wafer for Minimal Manufacturing System

Authors :
Hitoshi Habuka
Shinichi Ikeda
Shiro Hara
Ning Li
Source :
Physics Procedia. 46:230-238
Publication Year :
2013
Publisher :
Elsevier BV, 2013.

Abstract

A chemical vapor deposition reactor for producing thin silicon films was designed and developed for achieving a new electronic device production system, the Minimal Manufacturing, using a half-inch wafer. This system requires a rapid process by a small footprint reactor. This was designed and verified by employing the technical issues, such as (i) vertical gas flow, (ii) thermal operation using a highly concentrated infrared flux, and (iii) reactor cleaning by chlorine trifluoride gas. The combination of (i) and (ii) could achieve a low heating power and a fast cooling designed by the heat balance of the small wafer placed at a position outside of the reflector. The cleaning process could be rapid by (iii). The heating step could be skipped because chlorine trifluoride gas was reactive at any temperature higher than room temperature.

Details

ISSN :
18753892
Volume :
46
Database :
OpenAIRE
Journal :
Physics Procedia
Accession number :
edsair.doi.dedup.....26940e4f111c248e5cd6e69d881ba4e8
Full Text :
https://doi.org/10.1016/j.phpro.2013.07.059