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Statistical evaluation of a luminescence-based method for imaging the series resistance of solar cells
- Publication Year :
- 2012
-
Abstract
- In the last years photoluminescence (PL) imaging has become a standard characterization method for conventional silicon solar cells and wafers providing spatially resolved information for material characterization and process control. In this work, the method of the c oupled determination of d ark saturation c urrent and series r esistance (C-DCR) is evaluated on conventional silicon solar cells in terms of its accuracy, reliability and informative value based on a large number of conventional multicrystalline silicon solar cells. The statistical evaluation is based on a comparison of the series resistance mean values obtained from the C-DCR method with the global values obtained from the IV-characteristics within the standard cell testing. Furthermore, examples for its application are given and demonstrate that the minimum exposure time needed for the C-DCR method is short enough to allow an inline application of the method.
- Subjects :
- Standard cell
Materials science
Photoluminescence
Equivalent series resistance
Silicon
business.industry
chemistry.chemical_element
Silicium-Photovoltaik
Optics
Energy(all)
chemistry
solar cells
luminescence
Process control
characterization
Wafer
PV Produktionstechnologie und Qualitätssicherung
Charakterisierung
business
Saturation (chemistry)
Luminescence
Zellen und Module
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.doi.dedup.....26611c555113f29c6c05e1556ebc52a5