Fundamental Study on a Mechanism of Faulty Outputs from Cryptographic Modules due to IEMI

This paper investigates the mechanism underlying faulty outputs from cryptographic modules due to intentional electromagnetic interference IEMI, which causes information leakage in electronic devices without disrupting their functions or damaging their components. We show this fault mechanism through experiments using the faulty ciphertexts and pulse injection to a specific round in the encryption process. The experimental results indicate that faulty outputs from cryptographic modules are caused by setup time violation in the cryptographic module.