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Thermal characterization of MBE-grown GaN/AlGaN/GaN device on single crystalline diamond

Authors :
Alexandros Georgakilas
Jan Kuzmik
G. Tsiakatouras
Christophe Gaquiere
Sergey Bychikhin
O. Lancry
E. Pichonat
George Deligeorgis
Dionyz Pogany
Vienna University of Technology (TU Wien)
Laboratoire Avancé de Spectroscopie pour les Intéractions la Réactivité et l'Environnement - UMR 8516 (LASIRE)
Institut de Chimie du CNRS (INC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN)
Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
University of Crete [Heraklion] (UOC)
Source :
Journal of Applied Physics, Journal of Applied Physics, 2011, 109 (8), pp.086106. ⟨10.1063/1.3581032⟩, Journal of Applied Physics, American Institute of Physics, 2011, 109, pp.086106-1-3. ⟨10.1063/1.3581032⟩
Publication Year :
2011
Publisher :
AIP Publishing, 2011.

Abstract

Self-heating effects in a molecular beam epitaxy-grown GaN/AlGaN/GaN structure on a single crystalline diamond is investigated. A transient interferometric method, in combination with a three dimensional model, is used to describe a pulsed operation of a transistor-like heater, and a micro-Raman technique is used in a steady state. Good agreement is found between the techniques. The thermal conductivity of the diamond is found to be 2200 W/m K, and the thermal boundary resistance to the III-N epi-structure is

Details

ISSN :
10897550 and 00218979
Volume :
109
Database :
OpenAIRE
Journal :
Journal of Applied Physics
Accession number :
edsair.doi.dedup.....2202c3704973650876b21843b74203db