Back to Search
Start Over
Hot-carrier thermal conductivity from the simulation of submicron semiconductor structures
- Source :
- Semiconductor Science and Technology, Semiconductor Science and Technology, IOP Publishing, 1997, 12 (11), pp.1511-1513. ⟨10.1088/0268-1242/12/11/002⟩
- Publication Year :
- 1997
- Publisher :
- HAL CCSD, 1997.
-
Abstract
- We propose a novel numerical procedure to calculate the hot-carrier thermal conductivity in bulk semiconductors. The method is based on combining Monte Carlo and hydrodynamic simulations of carrier transport in submicron inhomogeneous structures. Application to a Si structure indicates a decrease over one order of magnitude of the thermal conductivity of electrons at electric fields over , in close agreement with recent results obtained within the correlation-function formalism.
- Subjects :
- Monte Carlo method
02 engineering and technology
Electron
01 natural sciences
[PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph]
Thermal conductivity
Electric field
0103 physical sciences
Materials Chemistry
Statistical physics
Electrical and Electronic Engineering
[PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]
ComputingMilieux_MISCELLANEOUS
010302 applied physics
Condensed matter physics
Chemistry
business.industry
021001 nanoscience & nanotechnology
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
[SPI.TRON]Engineering Sciences [physics]/Electronics
Formalism (philosophy of mathematics)
Semiconductor
[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]
0210 nano-technology
business
Order of magnitude
Subjects
Details
- Language :
- English
- ISSN :
- 02681242 and 13616641
- Database :
- OpenAIRE
- Journal :
- Semiconductor Science and Technology, Semiconductor Science and Technology, IOP Publishing, 1997, 12 (11), pp.1511-1513. ⟨10.1088/0268-1242/12/11/002⟩
- Accession number :
- edsair.doi.dedup.....20606a18e832710223fffc9f5e0ea4da
- Full Text :
- https://doi.org/10.1088/0268-1242/12/11/002⟩