Additional file 1: of Drastic effect of shearing on graphite microtexture: attention and application to Earth science

Figure S1. STEMâ EDS mapping data. (a) STEM image of mapped area, (b) EDS spectrum of the entire mapped area. (c) to (f) shows element maps of carbon (C), silicon (Si), aluminum (Al), and oxygen (O), respectively. Only C was detected in the map area, and impurities such as Si, Al, and O were not detected. In the EDS spectrum, small peaks of Si, Fe, and Co peaks are derived from pole piece and/or TEM sample holder, Ga and Pt peaks were derived at the FIB process, and Cu peaks were derived from the sample holder. (PDF 133 kb)