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A Probabilistic Approach for Failure Localization
- Source :
- 2017 International Conference on Optical Network Design and Modeling (ONDM), Scopus-Elsevier, ONDM
- Publication Year :
- 2017
- Publisher :
- Zenodo, 2017.
-
Abstract
- This work considers the problem of fault localization in transparent optical networks. The aim is to localize singlelink failures by utilizing statistical machine learning techniques trained on data that describe the network state upon current and past failure incidents. In particular, a Gaussian Process (GP) classifier is trained on historical data extracted from the examined network, with the goal of modeling and predicting the failure probability of each link therein. To limit the set of suspect links for every failure incident, the proposed approach is complemented with the utilization of a Graph-Based Correlation heuristic. The proposed approach is tested on a dataset generated for an OFDM-based optical network, demonstrating that it achieves a high localization accuracy. The proposed scheme can be used by service providers for reducing the Mean-Time-To- Repair of the failure.<br />© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. T. Panayiotou, S. P. Chatzis and G. Ellinas, "A probabilistic approach for failure localization," 2017 International Conference on Optical Network Design and Modeling (ONDM), Budapest, 2017, pp. 1-6.
- Subjects :
- Orthogonal frequency-division multiplexing
Computer science
02 engineering and technology
computer.software_genre
Machine learning
Gaussian processes for Machine Learning
symbols.namesake
020210 optoelectronics & photonics
Transparent optical networks
Fiber optic networks
0202 electrical engineering, electronic engineering, information engineering
Fault Localization
Gaussian process
Weibull distribution
Orthogonal frequency division multiplexing
Learning systems
business.industry
Failure probability
Probabilistic logic
Service provider
Electrical Engineering - Electronic Engineering - Information Engineering
OFDM networks
symbols
Engineering and Technology
020201 artificial intelligence & image processing
Data mining
Artificial intelligence
business
computer
Classifier (UML)
Subjects
Details
- ISBN :
- 978-3-901882-93-7
- ISBNs :
- 9783901882937
- Database :
- OpenAIRE
- Journal :
- 2017 International Conference on Optical Network Design and Modeling (ONDM), Scopus-Elsevier, ONDM
- Accession number :
- edsair.doi.dedup.....1c250af70a66b5c6085d11d46aea232e
- Full Text :
- https://doi.org/10.5281/zenodo.1036433