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A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions
- Source :
- APPLIED SURFACE SCIENCE. 255(4):1588-1590
- Publication Year :
- 2008
- Publisher :
- ELSEVIER SCIENCE BV, 2008.
-
Abstract
- In this report, we propose to use the incidence of cluster ions that are much larger than molecular ions as a fragment-free ionization technique for organic secondary ion mass spectrometry. Secondary ions were measured for amino acid and peptide targets bombarded with 3, 8 and 13 keV large Ar cluster ions. The relative yields of the fragment ions decreased drastically with increasing incident cluster size. Fragment-free ionization of the molecule was accomplished when large cluster ions with optimized size and energy were incident on a biomolecular sample.
- Subjects :
- Chemical ionization
Collision-induced dissociation
Mass spectrometry
Chemistry
Cluster ion
TOF
Analytical chemistry
General Physics and Astronomy
Surfaces and Interfaces
General Chemistry
Thermal ionization mass spectrometry
Fast atom bombardment
Condensed Matter Physics
Fragment-free ionization
Ion source
Sample preparation in mass spectrometry
Surfaces, Coatings and Films
Physics::Plasma Physics
Electron ionization
Subjects
Details
- Language :
- English
- ISSN :
- 01694332
- Volume :
- 255
- Issue :
- 4
- Database :
- OpenAIRE
- Journal :
- APPLIED SURFACE SCIENCE
- Accession number :
- edsair.doi.dedup.....1bbaa346cc5dc338407c9d1a1ca12b2a