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A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions

Authors :
Satoshi Ninomiya
Yoshihiko Nakata
Jiro Matsuo
Toshio Seki
Takaaki Aoki
Kazuya Ichiki
Yoshiro Honda
Source :
APPLIED SURFACE SCIENCE. 255(4):1588-1590
Publication Year :
2008
Publisher :
ELSEVIER SCIENCE BV, 2008.

Abstract

In this report, we propose to use the incidence of cluster ions that are much larger than molecular ions as a fragment-free ionization technique for organic secondary ion mass spectrometry. Secondary ions were measured for amino acid and peptide targets bombarded with 3, 8 and 13 keV large Ar cluster ions. The relative yields of the fragment ions decreased drastically with increasing incident cluster size. Fragment-free ionization of the molecule was accomplished when large cluster ions with optimized size and energy were incident on a biomolecular sample.

Details

Language :
English
ISSN :
01694332
Volume :
255
Issue :
4
Database :
OpenAIRE
Journal :
APPLIED SURFACE SCIENCE
Accession number :
edsair.doi.dedup.....1bbaa346cc5dc338407c9d1a1ca12b2a