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Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
- Source :
- Nature Communications, Vol 11, Iss 1, Pp 1-5 (2020), Nature Communications
- Publication Year :
- 2020
- Publisher :
- Nature Portfolio, 2020.
-
Abstract
- The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.
- Subjects :
- 0301 basic medicine
Computer science
Yield (finance)
Science
Stability (learning theory)
Solid-state
General Physics and Astronomy
02 engineering and technology
Two-dimensional materials
General Biochemistry, Genetics and Molecular Biology
03 medical and health sciences
Statistical analyses
Electronics
lcsh:Science
Reliability (statistics)
Electronic circuit
Multidisciplinary
Comment
General Chemistry
Benchmarking
021001 nanoscience & nanotechnology
Electrical and electronic engineering
Reliability engineering
030104 developmental biology
lcsh:Q
0210 nano-technology
Subjects
Details
- Language :
- English
- ISSN :
- 20411723
- Volume :
- 11
- Issue :
- 1
- Database :
- OpenAIRE
- Journal :
- Nature Communications
- Accession number :
- edsair.doi.dedup.....18d3141cdeff22c75351b852fe49c28b