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JEM-X: the x-ray monitor on INTEGRAL
- Source :
- SPIE Proceedings.
- Publication Year :
- 2004
- Publisher :
- SPIE, 2004.
-
Abstract
- The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm2, and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6° FOV, FWHM).
- Subjects :
- Physics::Instrumentation and Detectors
micro strip detector
Astrophysics::High Energy Astrophysical Phenomena
Field of view
X-ray telescope
01 natural sciences
law.invention
Jem-X
INTEGRAL
X-ray astronimy
Telescope
Optics
law
0103 physical sciences
Angular resolution
Coded aperture
010303 astronomy & astrophysics
Image resolution
Physics
010308 nuclear & particles physics
business.industry
Detector
Astrophysics::Instrumentation and Methods for Astrophysics
Gamma ray
business
Subjects
Details
- ISSN :
- 0277786X
- Database :
- OpenAIRE
- Journal :
- SPIE Proceedings
- Accession number :
- edsair.doi.dedup.....13e9279aa76e6ba37ca74a521d34da54