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JEM-X: the x-ray monitor on INTEGRAL

Authors :
Marco Feroci
Josef Polny
A. A. Zdziarski
P. B. Mogensen
V. Collado
I. L. Rasmussen
Jose-Luis Requena
G. Loffredo
Fernando Cerdeira Pérez
Roland Svensson
Herbert W. Schnopper
Osmi Vilhu
J. Peris
K. Omoe
J. M. Rodrigo
Niels J. Westergaard
S. M. Pedersen
A. J. Castro-Tirado
K. Harpo Andersen
Carl Budtz-Jørgensen
C. A. Oxborrow
Veikko J. Kamarainen
Filippo Frontera
Carlo Pelliciari
S. Laursen
Jérôme Chenevez
Rene Engel Kristansen
Allan Hornstrup
V. Carassiti
Alda Rubini
S. Larsson
M. Morawski
Guido Zavattini
P. A. Jensen
E. Morelli
Victor Reglero
T. Andersson
Niels Lund
Enrico Costa
S. Brandt
Juhani Huovelin
G. Juchnikowski
Alfredo Morbidini
Source :
SPIE Proceedings.
Publication Year :
2004
Publisher :
SPIE, 2004.

Abstract

The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm2, and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6° FOV, FWHM).

Details

ISSN :
0277786X
Database :
OpenAIRE
Journal :
SPIE Proceedings
Accession number :
edsair.doi.dedup.....13e9279aa76e6ba37ca74a521d34da54