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On the robustness of R-2R ladder DACs

Authors :
Michael Peter Kennedy
Source :
IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications. 47:109-116
Publication Year :
2000
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2000.

Abstract

A model of the linear R-2R ladder digital-to-analog converter (DAC) is developed in terms of the ratios of the effective resistances at the nodes of the ladder. This formulation demonstrates clearly why an infinite number of different sets of resistors can produce the same linearity error and shows how this error can be reduced by trimming. The relationship between the weights of the bits and the resistor ratios suggests appropriate trimming, design, and test strategies.

Details

ISSN :
10577122
Volume :
47
Database :
OpenAIRE
Journal :
IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications
Accession number :
edsair.doi.dedup.....1391b226b093f17d6269ae95fdc911d0