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Soft X-ray angle-resolved photoemission with micro-positioning techniques for metallic V2O3
- Source :
- Journal of Synchrotron Radiation
- Publication Year :
- 2015
- Publisher :
- International Union of Crystallography (IUCr), 2015.
-
Abstract
- Soft X-ray micro-ARPES measurements have successfully been applied to band mapping of the strongly correlated metallic V2O3.<br />Soft X-ray angle-resolved photoemission has been performed for metallic V2O3. By combining a microfocus beam (40 µm × 65 µm) and micro-positioning techniques with a long-working-distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of several tens of µm. The photoemission spectra show a clear position dependence, reflecting the morphology of the cleaved sample surface. By selecting high-quality flat regions on the sample surface, it has been possible to perform band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional angle-resolved photoemission spectroscopy for typical three-dimensional correlated materials where large cleavage planes are rarely obtained.
- Subjects :
- angle-resolved photoemission spectroscopy (ARPES)
Nuclear and High Energy Physics
Radiation
Materials science
Microscope
business.industry
Photoemission spectroscopy
Inverse photoemission spectroscopy
Angle-resolved photoemission spectroscopy
Cleavage (crystal)
micro-positioning
Research Papers
law.invention
soft X-ray
strongly correlated oxide
Optics
X-ray photoelectron spectroscopy
law
Secondary emission
Spectroscopy
business
Instrumentation
Subjects
Details
- ISSN :
- 16005775
- Volume :
- 22
- Database :
- OpenAIRE
- Journal :
- Journal of Synchrotron Radiation
- Accession number :
- edsair.doi.dedup.....12179f31e9eec40ea472a81a046e8c09