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Faultprog: Testing the Accuracy of Binary-Level Software Fault Injection
- Source :
- IEEE Transactions on Dependable and Secure Computing. 15:40-53
- Publication Year :
- 2018
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2018.
-
Abstract
- Off-The-Shelf (OTS) software components are the cornerstone of modern systems, including safety-critical ones. However, the dependability of OTS components is uncertain due to the lack of source code, design artifacts and test cases, since only their binary code is supplied. Fault injection in components’ binary code is a solution to understand the risks posed by buggy OTS components. In this paper, we consider the problem of the accurate mutation of binary code for fault injection purposes. Fault injection emulates bugs in high-level programming constructs (assignments, expressions, function calls, ...) by mutating their translation in binary code. However, the semantic gap between the source code and its binary translation often leads to inaccurate mutations. We propose Faultprog , a systematic approach for testing the accuracy of binary mutation tools. Faultprog automatically generates synthetic programs using a stochastic grammar, and mutates both their binary code with the tool under test, and their source code as reference for comparisons. Moreover, we present a case study on a commercial binary mutation tool, where Faultprog was adopted to identify code patterns and compiler optimizations that affect its mutation accuracy.
- Subjects :
- 021103 operations research
Source code
Theoretical computer science
Dead code
Computer science
media_common.quotation_subject
0211 other engineering and technologies
Code coverage
020207 software engineering
Static program analysis
02 engineering and technology
Fault injection
Computer engineering
0202 electrical engineering, electronic engineering, information engineering
Binary code
Unreachable code
Electrical and Electronic Engineering
Redundant code
Software Reliability, Fault Injection
media_common
Subjects
Details
- ISSN :
- 15455971
- Volume :
- 15
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Dependable and Secure Computing
- Accession number :
- edsair.doi.dedup.....10d1149654c72dd8e37e8fe78f61335e