Back to Search
Start Over
Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N
- Source :
- Journal of Applied Physics, Journal of Applied Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩, Journal of Applied Physics, American Institute of Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩
- Publication Year :
- 2016
- Publisher :
- HAL CCSD, 2016.
-
Abstract
- The ternary semiconductor alloy Al0.25Ga0.75N has been analyzed by means of correlated photoluminescence spectroscopy and atom probe tomography (APT). We find that the composition measured by APT is strongly dependent on the surface electric field, leading to erroneous measurements of the alloy composition at high field, due to the different evaporation behaviors of Al and Ga atoms. After showing how a biased measurement of the alloy content leads to inaccurate predictions on the optical properties of the material, we develop a correction procedure which yields consistent transition and localization energies for the alloy photoluminescence. (C) 2016 AIP Publishing LLC.
- Subjects :
- 010302 applied physics
[PHYS]Physics [physics]
Photoluminescence
Materials science
Alloy
General Physics and Astronomy
02 engineering and technology
Atom probe
engineering.material
021001 nanoscience & nanotechnology
01 natural sciences
Evaporation (deposition)
law.invention
Condensed Matter::Materials Science
law
Electric field
0103 physical sciences
engineering
Semiconductor alloys
Atomic physics
0210 nano-technology
Ternary operation
Spectroscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00218979 and 10897550
- Database :
- OpenAIRE
- Journal :
- Journal of Applied Physics, Journal of Applied Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩, Journal of Applied Physics, American Institute of Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩
- Accession number :
- edsair.doi.dedup.....0f04e0662317a5debc2704de3109a102