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Design and Test of Crab-Shaped Negative Group Delay Circuit

Authors :
Glauco Fontgalland
Fayu Wan
Sebastien Lallechere
Wenceslas Rahajandraibe
Blaise Ravelo
Nanjing University of Information Science and Technology (NUIST)
Institut Pascal (IP)
Centre National de la Recherche Scientifique (CNRS)-Université Clermont Auvergne (UCA)-Institut national polytechnique Clermont Auvergne (INP Clermont Auvergne)
Université Clermont Auvergne (UCA)-Université Clermont Auvergne (UCA)
Universidade Federal de Campina Grande [Campina Grande] (UFCG)
Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP)
Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)
Source :
IEEE Design & Test, IEEE Design & Test, 2022, 39 (1), pp.67-76. ⟨10.1109/MDAT.2021.3053556⟩, IEEE Design & Test, IEEE, 2021, pp.1-1. ⟨10.1109/MDAT.2021.3053556⟩, IEEE Design & Test, 2021, pp.1-1. ⟨10.1109/MDAT.2021.3053556⟩
Publication Year :
2022
Publisher :
HAL CCSD, 2022.

Abstract

This paper presents the design and test of a distributed planar microwave circuit presenting a crab-shape topology. The circuit’s topology consists of transmission lines (TLs) associated in feedback with two cascaded coupled lines (CLs). This topology has the characteristics of a bandpass negative group delay (NGD) function. The analytical model allowing to determine the group delay (GD) is established from S-parameter approach and the analysis of NGD crab topology is described. The NGD existence condition as a function of the topological parameters is presented. The NGD circuit proof-of-concept (PoC) is designed, simulated, and fabricated to understand and validate the proposed NGD functions. The measured, simulated, and theoretical results are in good agreement. As designed, the band pass NGD behavior is observed around 3 GHz with NGD of approximately -4.8 ns.

Details

Language :
English
ISSN :
21682356
Database :
OpenAIRE
Journal :
IEEE Design & Test, IEEE Design & Test, 2022, 39 (1), pp.67-76. ⟨10.1109/MDAT.2021.3053556⟩, IEEE Design & Test, IEEE, 2021, pp.1-1. ⟨10.1109/MDAT.2021.3053556⟩, IEEE Design & Test, 2021, pp.1-1. ⟨10.1109/MDAT.2021.3053556⟩
Accession number :
edsair.doi.dedup.....0ee68738a3b3405ce95d82ec8ced5e9a
Full Text :
https://doi.org/10.1109/MDAT.2021.3053556⟩