A compact flat-crystal X-ray spectrometer for external beam PIXE measurements

Authors :: P. Tesauro
Giuliano Parrini
Pier Andrea Mandò
A. Pecchioli
P. Sona
Source :: Scopus-Elsevier
Publication Year :: 1996
Publisher :: Elsevier BV, 1996.
Abstract: A wavelength dispersive system based on a flat crystal coupled to a CCD position-sensitive detector is described. The system, to be used in conjunction with an external beam facility for PIXE measurements, is particularly compact, easy to use, and has a useful energy range extending from about 4 to 13 keV. The performance of the system with respect to efficiency and energy resolution is studied as a function of different experimental conditions. Possible simple applications are briefly discussed.

Subjects :: Physics
Nuclear and High Energy Physics
X-ray spectroscopy
Range (particle radiation)
business.industry
Detector
Resolution (electron density)
Crystal
Wavelength
Optics
business
Instrumentation
Energy (signal processing)
Beam (structure)

ISSN :: 0168583X
Volume :: 108
Database :: OpenAIRE
Journal :: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Accession number :: edsair.doi.dedup.....0e6ed4cef26c517ccc1a17b6bf1a60ac
Full Text :: https://doi.org/10.1016/0168-583x(95)00787-3